Workshop 04
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Overview:
This workshop introduces one-class classification (OCC), a learning paradigm for scenarios where training data are available only from a single target class, while other classes are scarce, unknown, or difficult to obtain. It discusses the limitations of traditional OCC methods, particularly in handling high-dimensional and complex data, and presents subspace learning-based OCC as an effective and principled solution. The workshop covers core theoretical foundations, optimization frameworks, and recent advances, including joint learning of subspaces and data descriptions, graph-based formulations, and multi-view extensions. Participants will gain practical insights through case studies and demonstrations, illustrating how these methods can be applied to anomaly detection and data-scarce learning problems across domains.
Objectives:
- Understand the fundamentals and challenges of one-class classification (OCC).
- Identify limitations of conventional OCC methods in high-dimensional and complex data settings.
- Learn the principles of subspace learning-based OCC.
- Explore joint optimization of subspace representations and data descriptions.
- Understand graph-based and multi-view extensions of OCC methods.
- Apply OCC techniques to anomaly detection and data-scarce scenarios.
- Gain practical insights through examples and demonstrations.
- Develop the ability to select and adapt subspace learning-based OCC methods for different applications.
